IEC 60747-7-2010 半导体器件.分立器件.第7部分:双极晶体管
作者:标准资料网 时间:2024-05-04 17:49:52 浏览:8576
来源:标准资料网
下载地址: 点击此处下载
【英文标准名称】:Semiconductordevices-Discretedevices-Part7:Bipolartransistors
【原文标准名称】:半导体器件.分立器件.第7部分:双极晶体管
【标准号】:IEC60747-7-2010
【标准状态】:现行
【国别】:国际
【发布日期】:2010-12
【实施或试行日期】:2010-12
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/SC47E
【标准类型】:()
【标准水平】:()
【中文主题词】:验收;验收检验;验收试验;双极;双极晶体管;组件;定义(术语);分立式;分立器件;电气工程;电子工程;电子设备及元件;高频;检验;集成电路;布置;寿命;极限(数学);低频;低频工程;作标记;测量;测量技术;微波晶体管;操作时间;功率晶体管;特性;射频;射频设备;标准参考测量方法;基准方法;可靠度;半导体器件;半导体;开关晶体管;符号;试验;晶体管;电压
【英文主题词】:Acceptance;Acceptanceinspection;Acceptancetests;Bipolar;Bipolartransistors;Components;Definitions;Discrete;Discretedevices;Electricalengineering;Electronicengineering;Electronicequipmentandcomponents;Highfrequencies;Inspection;Integratedcircuits;Layout;Life(durability);Limits(mathematics);Lowfrequencies;Low-frequencyengineering;Marking;Measurement;Measuringtechniques;Microwavetransistors;Operatingtime;Powertransistors;Properties;Radiofrequencies;Radiofrequencyapparatus;Referencemeasuringmethods;Referencemethods;Reliability;Semiconductordevices;Semiconductors;Switchingtransistors;Symbols;Testing;Transistors;Voltage
【摘要】:ThispartofIEC60747-7givestherequirementsapplicabletothefollowingsub-categoriesofbipolartransistorsexcludingmicrowavetransistors.–Smallsignaltransistors(excludingswitchingandmicrowaveapplications);–Linearpowertransistors(excludingswitching,high-frequency,andmicrowaveapplications);–High-frequencypowertransistorsforamplifierandoscillatorapplications;–Switchingtransistorsforhighspeedswitchingandpowerswitchingapplications;–Resistorbiasedtransistors.
【中国标准分类号】:L41
【国际标准分类号】:31_080_30
【页数】:214P.;A4
【正文语种】:
【原文标准名称】:半导体器件.分立器件.第7部分:双极晶体管
【标准号】:IEC60747-7-2010
【标准状态】:现行
【国别】:国际
【发布日期】:2010-12
【实施或试行日期】:2010-12
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/SC47E
【标准类型】:()
【标准水平】:()
【中文主题词】:验收;验收检验;验收试验;双极;双极晶体管;组件;定义(术语);分立式;分立器件;电气工程;电子工程;电子设备及元件;高频;检验;集成电路;布置;寿命;极限(数学);低频;低频工程;作标记;测量;测量技术;微波晶体管;操作时间;功率晶体管;特性;射频;射频设备;标准参考测量方法;基准方法;可靠度;半导体器件;半导体;开关晶体管;符号;试验;晶体管;电压
【英文主题词】:Acceptance;Acceptanceinspection;Acceptancetests;Bipolar;Bipolartransistors;Components;Definitions;Discrete;Discretedevices;Electricalengineering;Electronicengineering;Electronicequipmentandcomponents;Highfrequencies;Inspection;Integratedcircuits;Layout;Life(durability);Limits(mathematics);Lowfrequencies;Low-frequencyengineering;Marking;Measurement;Measuringtechniques;Microwavetransistors;Operatingtime;Powertransistors;Properties;Radiofrequencies;Radiofrequencyapparatus;Referencemeasuringmethods;Referencemethods;Reliability;Semiconductordevices;Semiconductors;Switchingtransistors;Symbols;Testing;Transistors;Voltage
【摘要】:ThispartofIEC60747-7givestherequirementsapplicabletothefollowingsub-categoriesofbipolartransistorsexcludingmicrowavetransistors.–Smallsignaltransistors(excludingswitchingandmicrowaveapplications);–Linearpowertransistors(excludingswitching,high-frequency,andmicrowaveapplications);–High-frequencypowertransistorsforamplifierandoscillatorapplications;–Switchingtransistorsforhighspeedswitchingandpowerswitchingapplications;–Resistorbiasedtransistors.
【中国标准分类号】:L41
【国际标准分类号】:31_080_30
【页数】:214P.;A4
【正文语种】:
下载地址: 点击此处下载